Tools for Materials Characterization
Si, Ge, GaAs, InGaAs, InP, CdTe, CdZnTe, HgCdTe, MnCdTe, SiC, AlN, AlGaN, and more
Real-time monitoring of crystal's response to ionizing radiation
Design-stage thermal analysis of integrated circuits
HPC cluster solves 270 million unknowns in 47 minutes
Rapid 3D scans, defect quantification, bandgap estimation and more
Oxygen measurements, 3D wafer mapping, gamma spectroscopy, and moreMore details...
CapeSym develops engineering design and process optimization software for thermal analysis, crystal growth, radiation measurement, and material characterization.
CapeSym offers a wide variety of services including thermal analysis, engineering design consultation, and characterization of materials using our in-house tools.